Smart MEMS concept for high secure RF and millimeterwave communications. - David Dubuc; M. Saddaoui; S. Mellé; F. Flourens; L. Rabbia; Benoit Ducarouge; Katja Grenier; Patrick Pons; Ali Boukabache; Laurent Bary (Microelectron. Reliab., 2004)

Thermal and electrostatic reliability characterization in RF MEMS switches. - Q.-H. Duong; Lionel Buchaillot; Dominique Collard; Petra Schmitt; Xavier Lafontan; Patrick Pons; F. Flourens; Francis Pressecq (Microelectron. Reliab., 2005)

Biaxial initial stress characterization of bilayer gold RF-switches. - K. Yacine; F. Flourens; David Bourrier; Ludovic Salvagnac; P. Calmont; Xavier Lafontan; Q.-H. Duong; Lionel Buchaillot; D. Peyrou; Patrick Pons (Microelectron. Reliab., 2005)