Study of influence of failure modes on lifetime distribution prediction of 1.55 μm DFB Laser diodes using weak drift of monitored parameters during ageing tests. - Laurent Mendizabal; Laurent Béchou; Yannick Deshayes; Frédéric Verdier; Yves Danto; Dominique Laffitte; Jean-Luc Goudard; F. Houé (Microelectron. Reliab., 2004)