Design considerations for a CMOS 65-nm RTN-based PUF. - Eros Camacho-Ruiz; F. J. Rubio-Barbero; Rafael Castro-López; Elisenda Roca; Francisco V. Fernández 001 (SMACD, 2023)

A Peak Detect & Hold circuit to measure and exploit RTN in a 65-nm CMOS PUF. - F. J. Rubio-Barbero; Eros Camacho-Ruiz; Rafael Castro-López; Elisenda Roca; Francisco V. Fernández 001 (SMACD, 2023)

Harvesting RTN for True Random Number Generators and Physical Unclonable Functions. - F. J. Rubio-Barbero; F. de Los Santos-Prieto; Rafael Castro-López; Elisenda Roca; Francisco V. Fernández 001 (SMACD, 2024)

Optimization-based bit selection technique to improve the reliability of PUFs. - F. de Los Santos-Prieto; F. J. Rubio-Barbero; Rafael Castro-López; Elisenda Roca; Francisco V. Fernández 001 (SMACD, 2024)

A Comprehensive Approach to Improving the Thermal Reliability of RTN-Based PUFs. - F. de Los Santos-Prieto; F. J. Rubio-Barbero; Rafael Castro-López; Elisenda Roca; Francisco V. Fernández 001 (IEEE Trans. Circuits Syst. I Regul. Pap., 2025)