A fringing-capacitance model for deep-submicron MOSFET with high-k gate dielectric. - F. Ji; Jing-Ping Xu; Pui-To Lai; J. G. Guan (Microelectron. Reliab., 2008)

Influence of sidewall spacer on threshold voltage of MOSFET with high-k gate dielectric. - Jing-Ping Xu; F. Ji; Pui-To Lai; J. G. Guan (Microelectron. Reliab., 2008)