An Overview of the Applications of a Pulsed Laser System for SEU Testing. - Vincent Pouget; Pascal Fouillat; Dean Lewis; Hervé Lapuyade; L. Sarger; F. M. Roche; S. Duzellier; R. Ecoffet (IOLTW, 2000)

Integration of Robustness in the Design of a Cell. - Jean-Max Dutertre; F. M. Roche; Guy Cathébras (VLSI-SOC, 2001)