A modular test structure for CMOS mismatch characterization. - Massimo Conti; Paolo Crippa; Francesco Fedecostunte; Simone Orcioni; F. Ricciardi; Claudio Turchetti; Loris Vendrame (ISCAS (5), 2003)

Design of a 4.4 to 5 GHz LNA in 0.25µm SiGe BiCMOS technology. - Paolo Crippa; Simone Orcioni; F. Ricciardi; Claudio Turchetti (ISCAS (1), 2003)