Thermal approach of defects generation on copper/organic dielectric interface due to SEM inspections. - Lionel Dantas de Morais; F. Allanic; F. Roqueta; J. P. Rebrasse (Microelectron. Reliab., 2007)

Failure mechanisms of discrete protection device subjected to repetitive electrostatic discharges (ESD). - Marianne Diatta; Emilien Bouyssou; David Trémouilles; P. Martinez; F. Roqueta; O. Ory; Marise Bafleur (Microelectron. Reliab., 2009)