Feature decomposition from solid models for automatic flattening. - H. Chuang Sheng; F. S. Huang (Comput. Aided Des., 1996)

RF stress effects on CMOS LC-loaded VCO reliability evaluated by experiments. - H. D. Yen; Jiann-Shiun Yuan; Ruey-Lue Wang; G. W. Huang; W. K. Yeh; F. S. Huang (Microelectron. Reliab., 2012)