Effects of hydrogenation on the performance and stability of p-channel polycrystalline silicon thin-film transistors. - N. A. Hastas; C. A. Dimitriadis; F. V. Farmakis; G. Kamarinos (Microelectron. Reliab., 2003)

Degradation of double-gate polycrystalline silicon TFTs due to hot carrier stress. - F. V. Farmakis; Giannis P. Kontogiannopoulos; Dimitrios N. Kouvatsos; Apostolos T. Voutsas (Microelectron. Reliab., 2007)