Inspection point placement and path planning algorithms for automatic CMM inspection. - V. A. Albuquerque; F. W. Liou; Owen Robert Mitchell (Int. J. Comput. Integr. Manuf., 2000)

Economical impact of RFID implementation in remanufacturing: a Chaos-based Interactive Artificial Bee Colony approach. - Vishwa Vijay Kumar; F. W. Liou; S. N. Balakrishnan; Vikas Kumar 001 (J. Intell. Manuf., 2015)