Coffee certification criterion using the photoacoustic technique. - Fernando Gordillo Delgado; Fabián Zárate-Rincón; J. Aicardo Ortega Vela (Microelectron. J., 2008)

A review of DC extraction methods for MOSFET series resistance and mobility degradation model parameters. - Adelmo Ortiz-Conde; Andrea Sucre-González; Fabián Zárate-Rincón; Reydezel Torres-Torres; Roberto S. Murphy-Arteaga; Juin J. Liou; Francisco J. García-Sánchez (Microelectron. Reliab., 2017)