Characterization and Modeling of Gate-Induced-Drain-Leakage. - Fabien Gilibert; Denis Rideau; Alexandre Dray; François Agut; Michel Minondo; Andre Juge; Pascal Masson; Rachid Bouchakour (IEICE Trans. Electron., 2005)

Artificial neural network-based solution for PSP MOSFET model card extraction. - Alba Ordonez Rodriguez; Fabien Gilibert; Francois Paolini; Pascal Urard; Roberto Guizzetti; John Samuel 003; Remy Cellier; Lioua Labrak; Bastien Deveautour (VLSID, 2024)