Dc and low frequency noise analysis of hot-carrier induced degradation of low complexity 0.13 mum CMOS bipolar transistors. - P. Benoit; Jérémy Raoult; C. Delseny; Fabien Pascal; L. Snadny; J. C. Vildeuil; M. Marin; B. Martinet; D. Cottin; Olivier Noblanc (Microelectron. Reliab., 2005)

Study of low frequency noise in advanced SiGe: C heterojunction bipolar transistors. - Marcelino Seif; Fabien Pascal; Bruno Sagnes; Alain Hoffmann; Sébastien Haendler; Pascal Chevalier 002; Daniel Gloria (ESSDERC, 2014)

Dispersion study of DC and Low Frequency Noise in SiGe: C Heterojunction Bipolar Transistors used for mm-Wave to Terahertz applications. - Marcelino Seif; Fabien Pascal; Bruno Sagnes; Alain Hoffmann; Sébastien Haendler; Pascal Chevalier 002; Daniel Gloria (Microelectron. Reliab., 2014)

Development and improvement of acoustic sensors for the detection of pollutants in aquatic environments. - David Lapeine; Fabien Pascal; Jean-Yves Ferrandis; Didier Laux; Philippe Combette (I2MTC, 2017)

Characterization, modeling and comparison of 1/f noise in Si/SiGe: C HBTs issued from three advanced BiCMOS technologies. - Marcelino Seif; Fabien Pascal; Bruno Sagnes; J. Elbeyrouthy; Alain Hoffmann; Sébastien Haendler; Pascal Chevalier 002; Daniel Gloria (ICM, 2017)