Comparison of modeling approaches for transistor degradation: model card adaptations vs subcircuits. - André Lange; Fabio A. Velarde Gonzalez; Insaf Lahbib; Sonja Crocoll (ESSDERC, 2019)

Supporting analog design for reliability by efficient provision of reliability information to designers. - Fabio A. Velarde Gonzalez; Lukas Hahne; Katrin Ortstein; André Lange; Sonja Crocoll (DDECS, 2023)