Holding voltage investigation of advanced SCR-based protection structures for CMOS technology. - Augusto Tazzoli; Fabio Alessio Marino; Martina Cordoni; A. Benvenuti; Paolo Colombo; Enrico Zanoni; Gaudenzio Meneghesso (Microelectron. Reliab., 2007)

Advanced simulation methods for the development and characterization of new devices. - Fabio Alessio Marino (2010)

Breakdown investigation in GaN-based MIS-HEMT devices. - Fabio Alessio Marino; Davide Bisi; Matteo Meneghini; Giovanni Verzellesi; Enrico Zanoni; Marleen Van Hove; Shuzhen You; Stefaan Decoutere; Denis Marcon; Steve Stoffels; Nicolo Ronchi; Gaudenzio Meneghesso (ESSDERC, 2014)