Investigation of charging mechanisms in metal-insulator-metal structures. - M. A. Exarchos; V. Theonas; Patrick Pons; George J. Papaioannou; S. Mellé; David Dubuc; Fabio Coccetti; Robert Plana (Microelectron. Reliab., 2005)

Electrostatic discharge failure analysis of capacitive RF MEMS switches. - Jinyu Jason Ruan; Nicolas Nolhier; Marise Bafleur; Laurent Bary; Fabio Coccetti; T. Lisec; Robert Plana (Microelectron. Reliab., 2007)

Voltage and temperature effect on dielectric charging for RF-MEMS capacitive switches reliability investigation. - Mohamed Lamhamdi; Patrick Pons; Usama Zaghloul; Laurent Boudou; Fabio Coccetti; Jean Guastavino; Y. Segui; George J. Papaioannou; Robert Plana (Microelectron. Reliab., 2008)

Alpha particle radiation effects in RF MEMS capacitive switches. - Jinyu Jason Ruan; E. Papandreou; Mohamed Lamhamdi; Matroni Koutsoureli; Fabio Coccetti; Patrick Pons; George J. Papaioannou; Robert Plana (Microelectron. Reliab., 2008)

ESD failure signature in capacitive RF MEMS switches. - Jinyu Jason Ruan; George J. Papaioannou; Nicolas Nolhier; Nicolas Mauran; Marise Bafleur; Fabio Coccetti; Robert Plana (Microelectron. Reliab., 2008)

Deployment and management of large planar reflectarray antennas simulation on grid. - Rémi Sharrock; Fadi Khalil; Thierry Monteil 001; Hervé Aubert; Fabio Coccetti; Patricia Stolf; Laurent Broto; Robert Plana (CLADE@HPDC, 2009)

Capacitive RF MEMS analytical predictive reliability and lifetime characterization. - Mohamed Matmat; Fabio Coccetti; Antoine Marty; Robert Plana; Christophe Escriba; Jean-Yves Fourniols; Daniel Estève (Microelectron. Reliab., 2009)

Accelerated lifetime test of RF-MEMS switches under ESD stress. - Jinyu Jason Ruan; Nicolas Nolhier; George J. Papaioannou; David Trémouilles; Vincent Puyal; C. Villeneuve; T. Idda; Fabio Coccetti; Robert Plana (Microelectron. Reliab., 2009)

Dielectric charging in silicon nitride films for MEMS capacitive switches: Effect of film thickness and deposition conditions. - Usama Zaghloul; George J. Papaioannou; Fabio Coccetti; Patrick Pons; Robert Plana (Microelectron. Reliab., 2009)

Three-Dimensional RF MEMS Switch for Power Applications. - Joo-Young Choi; Jinyu Jason Ruan; Fabio Coccetti; Stepan Lucyszyn (IEEE Trans. Ind. Electron., 2009)

Life expectancy and characterization of capacitive RF MEMS switches. - Mohamed Matmat; K. Koukos; Fabio Coccetti; T. Idda; Antoine Marty; Christophe Escriba; Jean-Yves Fourniols; Daniel Estève (Microelectron. Reliab., 2010)

Assessment of dielectric charging in electrostatically driven MEMS devices: A comparison of available characterization techniques. - Usama Zaghloul; Matroni Koutsoureli; H. Wang; Fabio Coccetti; George J. Papaioannou; Patrick Pons; Robert Plana (Microelectron. Reliab., 2010)

On the reliability of electrostatic NEMS/MEMS devices: Review of present knowledge on the dielectric charging and stiction failure mechanisms and novel characterization methodologies. - Usama Zaghloul; George J. Papaioannou; Bharat Bhushan; Fabio Coccetti; Patrick Pons; Robert Plana (Microelectron. Reliab., 2011)

Erratum to "On the reliability of electrostatic NEMS/MEMS devices: Review of present knowledge on the dielectric charging and stiction failure mechanisms and novel characterization methodologies" [MR 51/9-11 (2011) 1810-1818]. - Usama Zaghloul; George J. Papaioannou; Bharat Bhushan; Fabio Coccetti; Patrick Pons; Robert Plana (Microelectron. Reliab., 2011)

Large electromagnetic problem on large scale parallel computing systems. - Mihai Alexandru; Thierry Monteil 001; Fabio Coccetti; Hervé Aubert; Petr Lorenz (HPCS, 2012)

Estimation of RF performance from LF measurements: Towards the design for reliability in RF-MEMS. - Nuria Torres Matabosch; Mehmet Kaynak; Fabio Coccetti; Matthias Wietstruck; Bernd Tillack; Jean Louis Cazaux (Microelectron. Reliab., 2012)

An Accelerated Stress Test Method for Electrostatically Driven MEMS Devices. - Jinyu Jason Ruan; Nicolas Monnereau; David Trémouilles; Nicolas Mauran; Fabio Coccetti; Nicolas Nolhier; Robert Plana (IEEE Trans. Instrum. Meas., 2012)

Failure analysis and detection methodology for capacitive RF-MEMS switches based on BEOL BiCMOS process. - Nuria Torres Matabosch; Fabio Coccetti; Mehmet Kaynak; Beatrice Espana; Bernd Tillack; Jean-Louis Cazaux (Microelectron. Reliab., 2013)

Large electromagnetic simulation by hybrid approach on large-scale parallel computing systems. - Mihai Alexandru; Thierry Monteil 001; Petr Lorenz; Fabio Coccetti; Hervé Aubert (Concurr. Comput. Pract. Exp., 2015)

200 mm Wafer level graphene transfer by wafer bonding technique. - Mesut Inac; Grzegorz Lupina; Matthias Wietstruck; Marco Lisker; Mirko Fraschke; Andreas Mai; Fabio Coccetti; Mehmet Kaynak (ESSDERC, 2017)