Estimation of the accuracy of a reflector surface from the measured rms error. - Fabio E. Zocchi (IEEE Trans. Instrum. Meas., 2005)

Effect of Charge Recombination on Amplitude and Time Measurement of Induced Signals in Semiconductor Drift Detectors. - Massimo Lazzaroni; Fabio E. Zocchi (IEEE Trans. Instrum. Meas., 2007)

Design and qualification of the STREEGO multispectral payload. - Massimiliano Rossi 003; Luigina Arcangeli; Giovanni Bianucci; Giuseppe Capuano; Giuseppe Formicola; Pasquale Longobardi; Luca Maresi; Ruben Mazzoleni; Sebastiano M. Spinelli; Matteo Taccola; Marco Terraneo; Fabio E. Zocchi (Earth Observing Systems, 2017)