Field plate related reliability improvements in GaN-on-Si HEMTs. - Alessandro Chini; Fabio Soci; Fausto Fantini; Antonio Nanni; Alessio Pantellini; Claudio Lanzieri; Davide Bisi; Gaudenzio Meneghesso; Enrico Zanoni (Microelectron. Reliab., 2012)

Impact of field-plate geometry on the reliability of GaN-on-SiC HEMTs. - Alessandro Chini; Fabio Soci; Fausto Fantini; A. Nanni; A. Pantellini; Claudio Lanzieri; Gaudenzio Meneghesso; Enrico Zanoni (Microelectron. Reliab., 2013)

Traps localization and analysis in GaN HEMTs. - Alessandro Chini; Fabio Soci; Gaudenzio Meneghesso; Matteo Meneghini; Enrico Zanoni (Microelectron. Reliab., 2014)

Effects of buffer compensation strategies on the electrical performance and RF reliability of AlGaN/GaN HEMTs. - Davide Bisi; Antonio Stocco; Isabella Rossetto; Matteo Meneghini; Fabiana Rampazzo; Alessandro Chini; Fabio Soci; Alessio Pantellini; Claudio Lanzieri; Piero Gamarra; Cedric Lacam; M. Tordjman; et al. (Microelectron. Reliab., 2015)