On the measurement of crosstalk in integrated circuits. - Fabrice Caignet; S. D.-B. Dhia; Etienne Sicard (IEEE Trans. Very Large Scale Integr. Syst., 2000)

The challenge of signal integrity in deep-submicrometer CMOS technology. - Fabrice Caignet; Sonia Delmas-Bendhia; Etienne Sicard (Proc. IEEE, 2001)

Comparison among emission and susceptibility reduction techniques for electromagnetic interference in digital integrated circuits. - Ali Alaeldine; Nicolas Lacrampe; Alexandre Boyer; Richard Perdriau; Fabrice Caignet; Mohammed Ramdani 002; Etienne Sicard; M'hamed Drissi (Microelectron. J., 2008)

On-chip measurement to analyze failure mechanisms of ICs under system level ESD stress. - Fabrice Caignet; Nicolas Nolhier; Marise Bafleur; A. Wang; Nicolas Mauran (Microelectron. Reliab., 2013)

Building-up of system level ESD modeling: Impact of a decoupling capacitance on ESD propagation. - Nicolas Monnereau; Fabrice Caignet; David Trémouilles; Nicolas Nolhier; Marise Bafleur (Microelectron. Reliab., 2013)

Reliability of ESD protection devices designed in a 3D technology. - Bertrand Courivaud; Nicolas Nolhier; Gilles Ferru; Marise Bafleur; Fabrice Caignet (Microelectron. Reliab., 2014)

20 GHz on-chip measurement of ESD waveform for system level analysis. - Fabrice Caignet; Nicolas Nolhier; Marise Bafleur; A. Wang; Nicolas Mauran (Microelectron. Reliab., 2015)

Impact of non-linear capacitances on transient waveforms during system level ESD stress. - Frédéric Escudié; Fabrice Caignet; Nicolas Nolhier; Marise Bafleur (Microelectron. Reliab., 2016)

Prediction of LIN communication robustness against EFT events using dedicated failure models. - Frédéric Escudié; Fabrice Caignet; Nicolas Nolhier; Marise Bafleur (Microelectron. Reliab., 2017)

Closed-Form Expressions of Electric and Magnetic Near-Fields for the Calibration of Near-Field Probes. - Alexandre Boyer; Nicolas Nolhier; Fabrice Caignet; Sonia Ben Dhia (IEEE Trans. Instrum. Meas., 2021)

Analysis of Operational Amplifier Susceptibility to Multifrequency Disturbance. - A. Boyer; Fabrice Caignet (EMC Compo, 2024)