Transient dual interface measurement of junction-to-case thermal resistance in AlGaN/GaN HEMT utilizing an improved infrared microscope. - Yuwei Zhai; Faguo Liang; Chunsheng Guo; Yan Liu (Microelectron. Reliab., 2016)

Monte Carlo Analysis of Measurement Uncertainties for On-Wafer Multiline TRL Calibration Including Dynamic Accuracy. - Peng Luan; Yibang Wang; Wei Zhao; Chen Liu 024; Faguo Liang; Aihua Wu 007; Jing Du 004 (IEEE Trans. Instrum. Meas., 2020)

Optimal Design of Passive Devices for Verifying On-Wafer Noise Parameter Measurement Systems. - Aihua Wu 007; Xingchang Fu; Chen Liu 024; Chong Li; Yibang Wang; Faguo Liang; Peng Luan (IEEE Trans. Instrum. Meas., 2020)

Thermoreflectance property of gallium nitride. - Yusa Chen; Meizhang Wu; Jianghui Mo; Yan Liu; Yuwei Zhai; Wengang Wu; Aihua Wu; Faguo Liang (Microelectron. J., 2024)