Parametric DC and noise measurements in a unified test & characterization software tool framework. - Jose A. Rodriguez; Manuel Jiménez; William Morales; Fan-Chi Hou; Lucianne Millan; Rogelio Palomera (LATW, 2012)

Temperature dependence of threshold voltage fluctuations in CMOS transistors incorporating halo implant. - Hal Edwards; Niu Jin; Fan-Chi Hou; Li Jen Choi; Tracey Krakowski; Kuntal Joardar (ESSDERC, 2014)