When Optimized N-Detect Test Sets are Biased: An Investigation of Cell-Aware-Type Faults and N-Detect Stuck-At ATPG. - Fanchen Zhang; Micah Thornton; Jennifer Dworak (NATW, 2014)

Putting wasted clock cycles to use: Enhancing fortuitous cell-aware fault detection with scan shift capture. - Fanchen Zhang; Daphne Hwong; Yi Sun; Allison Garcia; Soha Alhelaly; Geoff Shofner; LeRoy Winemberg; Jennifer Dworak (ITC, 2016)

Using Existing Reconfigurable Logic in 3D Die Stacks for Test. - Fanchen Zhang; Yi Sun; Xi Shen; Kundan Nepal; Jennifer Dworak; Theodore W. Manikas; Ping Gui; R. Iris Bahar; Al Crouch; John C. Potter (NATW, 2016)

One more time! Increasing fault detection with scan shift capture. - Hui Jiang; Fanchen Zhang; Yi Sun; Jennifer Dworak (NATW, 2018)

Repurposing FPGAs for Tester Design to Enhance Field-Testing in a 3D Stack. - Yi Sun; Fanchen Zhang; Hui Jiang; Kundan Nepal; Jennifer Dworak; Theodore W. Manikas; R. Iris Bahar (J. Electron. Test., 2019)

Increased Detection of Hard-to-Detect Stuck-at Faults during Scan Shift. - Hui Jiang; Fanchen Zhang; Jennifer Dworak; Kundan Nepal; Theodore W. Manikas (J. Electron. Test., 2023)