Cyclic-CPRS : A Diagnosis Technique for BISTed Circuits for Nano-meter Technologies. - Chun-Yi Lee; Hung-Mao Lin; Fang-Min Wang; James Chien-Mo Li (ASP-DAC, 2007)

Column Parity Row Selection (CPRS) BIST Diagnosis Technique: Modeling and Analysis. - James Chien-Mo Li; Hung-Mao Lin; Fang-Min Wang (IEEE Trans. Computers, 2007)