Economics of "design for test" to remain competitive in the 90s. - Farzad Zarrinfar (J. Electron. Test., 1994)

A D&T Roundtable: Testing Mixed Logic and DRAM Chips. - Meh-Ron Amerian; William D. Atwell Jr.; Ian Burgess; Gary D. Fleeman; David Y. Lepejian; T. W. Williams; Farzad Zarrinfar; Yervant Zorian (IEEE Des. Test Comput., 1998)