Parallel Testing of Multi-port Static Random Access Memories for BIST. - Farzin Karimi; Fabrizio Lombardi (DFT, 2001)

A Parallel Approach for Testing Multi-Port Static Random Access Memories. - Farzin Karimi; Fabrizio Lombardi; V. Swamy Irrinki; T. Crosby (MTDT, 2001)

Fault Detection in a Tristate System Environment. - Wenyi Feng; Farzin Karimi; Fabrizio Lombardi (IEEE Micro, 2001)

Data Compression for System-on-Chip Testing Using ATE. - Farzin Karimi; Waleed Meleis; Zainalabedin Navabi; Fabrizio Lombardi (DFT, 2002)

A Scan-Bist Environment for Testing Embedded Memories. - Farzin Karimi; Fabrizio Lombardi (MTDT, 2002)

Random Testing of Multi-Port Static Random Access Memories. - Farzin Karimi; Fred J. Meyer; Fabrizio Lombardi (MTDT, 2002)

Hybrid Multisite Testing at Manufacturing. - Hamidreza Hashempour; Fred J. Meyer; Fabrizio Lombardi; Farzin Karimi (ITC, 2003)

Parallel testing of multi-port static random access memories. - Farzin Karimi; V. Swamy Irrinki; T. Crosby; Nohpill Park; Fabrizio Lombardi (Microelectron. J., 2003)

Using data compression in automatic test equipment for system-on-chip testing. - Farzin Karimi; Zainalabedin Navabi; Waleed Meleis; Fabrizio Lombardi (IEEE Trans. Instrum. Meas., 2004)

Applications of decorator and observer design patterns in functional verification. - Farzin Karimi (HLDVT, 2008)