Machine-Learning-Based Identification of Defect Patterns in Semiconductor Wafer Maps: An Overview and Proposal. - Fatima Adly; Paul D. Yoo; Sami Muhaidat; Yousof Al-Hammadi (IPDPS Workshops, 2014)

Simplified Subspaced Regression Network for Identification of Defect Patterns in Semiconductor Wafer Maps. - Fatima Adly; Omar Alhussein; Paul D. Yoo; Yousof Al-Hammadi; Kamal Taha; Sami Muhaidat; Young-Seon Jeong 001; Uihyoung Lee; Mohammed Ismail 001 (IEEE Trans. Ind. Informatics, 2015)