A Foveated Retina-Like Sensor Using CCD Technology. - Jan Van der Spiegel; G. Kreider; C. Claeys; I. Debusschere; Giulio Sandini; Paolo Dario; Fausto Fantini; P. Bellutti; Giovanni Soncini (Analog VLSI Implementation of Neural Systems, 1989)

VLSI reliability: Contributions from a three year national research program. - Giovanni Soncini; Claudio Canali; Enrico Zanoni; Francrsco Cors; Alessandro Diligenti; Fausto Fantini; Vito A. Monaco; Guido Masetti; Carlo Morandi (Eur. Trans. Telecommun., 1990)

Reliability physics of compound semiconductor transistors for microwave applications. - Mattia Borgarino; Roberto Menozzi; Domenico Dieci; Laura Cattani; Fausto Fantini (Microelectron. Reliab., 2001)

Editorial. - Fausto Fantini; Massimo Vanzi (Microelectron. Reliab., 2002)

Degradation Based Long-Term Reliability Assessment for Electronic Components in Submarine Applications. - V. Lista; P. Garbossa; T. Tomasi; Mattia Borgarino; Fausto Fantini; L. Gherardi; A. Righetti; M. Villa (Microelectron. Reliab., 2002)

Reliability in automotive electronics: a case study applied to diesel engine control. - G. Cassanelli; Fausto Fantini; G. Serra; S. Sgatti (Microelectron. Reliab., 2003)

High Electric Field Induced Degradation of the DC Characteristics in Si/SiGe HEMT's. - J. Kuchenbecker; Mattia Borgarino; M. Zeuner; U. König; Robert Plana; Fausto Fantini (Microelectron. Reliab., 2003)

Failure Analysis of RuO2 Thick Film Chip Resistors. - Simona Podda; G. Cassanelli; Fausto Fantini; Massimo Vanzi (Microelectron. Reliab., 2004)

Reliability predictions in electronic industrial applications. - G. Cassanelli; Giovanna Mura; F. Cesaretti; Massimo Vanzi; Fausto Fantini (Microelectron. Reliab., 2005)

Failure Analysis-assisted FMEA. - G. Cassanelli; Giovanna Mura; Fausto Fantini; Massimo Vanzi; Bernard Plano (Microelectron. Reliab., 2006)

Characterization and analysis of trap-related effects in AlGaN-GaN HEMTs. - Mustapha Faqir; Giovanni Verzellesi; Fausto Fantini; Francesca Danesin; Fabiana Rampazzo; Gaudenzio Meneghesso; Enrico Zanoni; Anna Cavallini; Antonio Castaldini; Nathalie Labat; André Touboul; Christian Dua (Microelectron. Reliab., 2007)

Sulfur-contamination of high power white LED. - Giovanna Mura; G. Cassanelli; Fausto Fantini; Massimo Vanzi (Microelectron. Reliab., 2008)

Analysis of current collapse effect in AlGaN/GaN HEMT: Experiments and numerical simulations. - Mustapha Faqir; Mohsine Bouya; Nathalie Malbert; Nathalie Labat; D. Carisetti; Benoit Lambert; Giovanni Verzellesi; Fausto Fantini (Microelectron. Reliab., 2010)

Experimental and simulated dc degradation of GaN HEMTs by means of gate-drain and gate-source reverse bias stress. - Valerio Di Lecce; Michele Esposto; Matteo Bonaiuti; Gaudenzio Meneghesso; Enrico Zanoni; Fausto Fantini; Alessandro Chini (Microelectron. Reliab., 2010)

Field plate related reliability improvements in GaN-on-Si HEMTs. - Alessandro Chini; Fabio Soci; Fausto Fantini; Antonio Nanni; Alessio Pantellini; Claudio Lanzieri; Davide Bisi; Gaudenzio Meneghesso; Enrico Zanoni (Microelectron. Reliab., 2012)

Impact of field-plate geometry on the reliability of GaN-on-SiC HEMTs. - Alessandro Chini; Fabio Soci; Fausto Fantini; A. Nanni; A. Pantellini; Claudio Lanzieri; Gaudenzio Meneghesso; Enrico Zanoni (Microelectron. Reliab., 2013)