An I-IP based approach for the monitoring of NBTI effects in SoCs. - C. Guardiani; A. Shibkov; Angelo Brambilla; Giancarlo Storti Gajani; Davide Appello; Fausto Piazza; Paolo Bernardi (IOLTS, 2009)

Development and application of the Oxide Stress Separation technique for the measurement of ONO leakage currents at low electric fields in 40 nm floating gate embedded-flash memory. - Adam Dobri; Simon Jeannot; Fausto Piazza; Carine Jahan; Jean Coignus; Luca Perniola; Francis Balestra (Microelectron. Reliab., 2017)