A new dynamic, self-consistent electro-thermal model of power HBTs and a novel interpretation of thermal collapse loci in multi-finger devices. - Federica Cappelluti; Fabrizio Bonani; Simona Donati Guerrieri; Giovanni Ghione; Marco Peroni; Antonio Cetronio; R. Graffitti (CICC, 2001)

Physics-based mixed-mode reverse recovery modeling and optimization of Si PiN and MPS fast recovery diodes. - Federica Cappelluti; Fabrizio Bonani; Mauro Furno; Giovanni Ghione; R. Carta; L. Bellemo; C. Bocchiola; Luigi Merlin (Microelectron. J., 2006)