Integrated circuits for particle physics experiments. - Walter Snoeys; Giovanni Anelli; Michael Campbell; Eugenio Cantatore; Federico Faccio; Erik H. M. Heijne; Pierre Jarron; Kostas Kloukinas; Alessandro Marchioro; Paulo Moreira; Thomas Toifl; Kenneth Wyllie (IEEE J. Solid State Circuits, 2000)

Total ionizing dose effects in shallow trench isolation oxides. - Federico Faccio; Hugh J. Barnaby; Xiao J. Chen; Daniel M. Fleetwood; Laura Gonella; Michael L. McLain; Ronald D. Schrimpf (Microelectron. Reliab., 2008)

An 8W-2MHz buck converter with adaptive dead time tolerant to radiation and high magnetic field. - Stefano Michelis; Bruno Allongue; G. Blanchot; Simone Buso; Federico Faccio; Cristian Fuentes; Alessandro Marchioro; Stefano Orlandi; Stefano Saggini; Giorgio Spiazzi; Maher Kayal (ESSCIRC, 2010)

Impact of GigaRad Ionizing Dose on 28 nm bulk MOSFETs for future HL-LHC. - Alessandro Pezzotta; C.-M. Zhang; Farzan Jazaeri; Claudio Bruschini; Giulio Borghello; Federico Faccio; S. Mattiazzo; Andrea Baschirotto; Christian C. Enz (ESSDERC, 2016)

Investigation of Scaling and Temperature Effects in Total Ionizing Dose (TID) Experiments in 65 nm CMOS. - Loukas Chevas; Aristeidis Nikolaou; Matthias Bucher; Nikolaos Makris; Alexia Papadopoulou; Apostolos Zografos; Giulio Borghello; Henri D. Koch; Federico Faccio (MIXDES, 2018)

Extending a 65nm CMOS process design kit for high total ionizing dose effects. - Aristeidis Nikolaou; Matthias Bucher; Nikos Makris; Alexia Papadopoulou; Loukas Chevas; Giulio Borghello; Henri D. Koch; Kostas Kloukinas; Tuomas S. Poikela; Federico Faccio (MOCAST, 2018)

A Reliability and Efficiency Optimization System for Hard-Switching DC/DC Converters. - Giacomo Ripamonti; Stefano Michelis; Federico Faccio; Stefano Saggini; Adil Koukab; Maher Kayal (NEWCAS, 2018)

Forward and Reverse Operation of Enclosed-Gate MOSFETs and Sensitivity to High Total Ionizing Dose. - Aristeidis Nikolaou; Loukas Chevas; Alexia Papadopoulou; Nikolaos Makris; Matthias Bucher; Giulio Borghello; Federico Faccio (MIXDES, 2019)