Improving Stress Quality for SoC Using Faster-than-At-Speed Execution of Functional Programs. - Paolo Bernardi; Alberto Bosio; Giorgio Di Natale; Andrea Guerriero; Ernesto Sánchez 001; Federico Venini (VLSI-SoC (Selected Papers), 2016)

Faster-than-at-speed execution of functional programs: An experimental analysis. - Paolo Bernardi; Alberto Bosio; Giorgio Di Natale; Andrea Guerriero; Federico Venini (VLSI-SoC, 2016)

A comprehensive methodology for stress procedures evaluation and comparison for Burn-In of automotive SoC. - Davide Appello; Paolo Bernardi; G. Giacopelli; Alessandro Motta; Alberto Pagani; Giorgio Pollaccia; C. Rabbi; Marco Restifo; P. Ruberg; Ernesto Sánchez 001; C. M. Villa; Federico Venini (DATE, 2017)

Robustness in automotive electronics: An industrial overview of major concerns. - Ulrich Backhausen; Oscar Ballan; Paolo Bernardi; Sergio de Luca; Julie Henzler; Thomas Kern; Davide Piumatti; Thomas Rabenalt; Krishnapriya Chakiat Ramamoorthy; Ernesto Sánchez 001; Alessandro Sansonetti; Rudolf Ullmann; et al. (IOLTS, 2017)

A DMA and CACHE-based stress schema for burn-in of automotive microcontroller. - Paolo Bernardi; Riccardo Cantoro; L. Gianotto; Marco Restifo; Ernesto Sánchez 001; Federico Venini; Davide Appello (LATS, 2017)

An Optimized Test During Burn-In for Automotive SoC. - Davide Appello; Conrad Bugeja; Giorgio Pollaccia; Paolo Bernardi; Riccardo Cantoro; Marco Restifo; Ernesto Sánchez 001; Federico Venini (IEEE Des. Test, 2018)

Adaptive Management Techniques for Optimized Burn-in of Safety-Critical SoC. - Davide Appello; Paolo Bernardi; Conrad Bugeja; Riccardo Cantoro; Giorgio Pollaccia; Marco Restifo; Federico Venini (J. Electron. Test., 2018)

An Evolutionary Algorithm Approach to Stress Program Generation During Burn-In. - Davide Appello; Paolo Bernardi; Conrad Bugeja; Riccardo Cantoro; Andrea Colazzo; Alessandro Motta; Alberto Pagani; Giorgio Pollaccia; Marco Restifo; Ernesto Sánchez 001; Federico Venini (J. Low Power Electron., 2018)