Felipe Rocha da Rosa
Orcid: 0000-0003-4964-5136Affiliations:
- Arm Ltd., Cambridge, UK
- Federal University of Rio Grande do Sul (UFRGS), PGMicro, Brazil
According to our database1,
Felipe Rocha da Rosa
authored at least 19 papers
between 2013 and 2022.
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Bibliography
2022
SOFIA: An automated framework for early soft error assessment, identification, and mitigation.
J. Syst. Archit., 2022
2021
An Extensive Soft Error Reliability Analysis of a Real Autonomous Vehicle Software Stack.
IEEE Trans. Circuits Syst. II Express Briefs, 2021
Evaluation of the soft error assessment consistency of a JIT-based virtual platform simulator.
IET Comput. Digit. Tech., 2021
2020
Soft Error Reliability Using Virtual Platforms - Early Evaluation of Multicore Systems
Springer, ISBN: 978-3-030-55703-4, 2020
2019
IEEE Trans. Circuits Syst. I Regul. Pap., 2019
Non-intrusive Fault Injection Techniques for Efficient Soft Error Vulnerability Analysis.
Proceedings of the 27th IFIP/IEEE International Conference on Very Large Scale Integration, 2019
Efficient Soft Error Vulnerability Analysis Using Non-intrusive Fault Injection Techniques.
Proceedings of the VLSI-SoC: New Technology Enabler, 2019
Proceedings of the 27th IFIP/IEEE International Conference on Very Large Scale Integration, 2019
2018
gem5-FIM: a flexible and scalable multicore soft error assessment framework to early reliability design space explorations.
Proceedings of the 9th IEEE Latin American Symposium on Circuits & Systems, 2018
Extensive evaluation of programming models and ISAs impact on multicore soft error reliability.
Proceedings of the 55th Annual Design Automation Conference, 2018
2017
Proceedings of the 15th IEEE International New Circuits and Systems Conference, 2017
Proceedings of the 24th IEEE International Conference on Electronics, Circuits and Systems, 2017
2016
Extending FreeRTOS to support dynamic and distributed mapping in multiprocessor systems.
Proceedings of the 2016 IEEE International Conference on Electronics, Circuits and Systems, 2016
2015
Microelectron. Reliab., 2015
Impact of dynamic voltage scaling and thermal factors on FinFET-based SRAM reliability.
Proceedings of the 2015 IEEE International Conference on Electronics, 2015
A fast and scalable fault injection framework to evaluate multi/many-core soft error reliability.
Proceedings of the 2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2015
2014
Proceedings of the 24th International Workshop on Power and Timing Modeling, 2014
2013
Instruction-driven timing CPU model for efficient embedded software development using OVP.
Proceedings of the 20th IEEE International Conference on Electronics, 2013
Proceedings of the 20th IEEE International Conference on Electronics, 2013