Modeling Thermal Laser Stimulation. - Felix Beaudoin; X. Chauffleur; Jean-Pierre Fradin; Philippe Perdu; Romain Desplats; Dean Lewis (Microelectron. Reliab., 2001)

Silicon Thinning and Polishing on Packaged Devices. - Felix Beaudoin; Philippe Perdu; Romain Desplats; Sebastien Rigo; Dean Lewis (Microelectron. Reliab., 2001)

Backside Localization of Current Leakage Faults Using Thermal Laser Stimulation. - Romain Desplats; Felix Beaudoin; Philippe Perdu; Patrick Poirier; David Trémouilles; Marise Bafleur; Dean Lewis (Microelectron. Reliab., 2001)

A New Versatile Testing Interface for Failure Analysis in Integrated Circuits. - Romain Desplats; Philippe Perdu; Felix Beaudoin (Microelectron. Reliab., 2001)

Front Side and Backside OBIT Mappings applied to Single Event Transient Testing. - Dean Lewis; Vincent Pouget; Thomas Beauchêne; Hervé Lapuyade; Pascal Fouillat; André Touboul; Felix Beaudoin; Philippe Perdu (Microelectron. Reliab., 2001)

A 2.5 Gbit/s CMOS optical receiver frontend. - Patrick Mitran; Felix Beaudoin; Mourad N. El-Gamal (ISCAS (5), 2002)

Backside Defect Localizations and Revelations Techniques on Gallium Arsenide (GaAs) Devices. - Felix Beaudoin; D. Carisetti; Romain Desplats; Philippe Perdu; Dean Lewis; J. C. Clement (Microelectron. Reliab., 2002)

Reliability Defect Monitoring with Thermal Laser Stimulation: Biased Versus Unbiased. - Felix Beaudoin; Gérald Haller; Philippe Perdu; Romain Desplats; Thomas Beauchêne; Dean Lewis (Microelectron. Reliab., 2002)

Backside Hot Spot Detection Using Liquid Crystal Microscopy. - Olivier Crépel; Felix Beaudoin; Lionel Dantas de Morais; Gérald Haller; C. Goupil; Philippe Perdu; Romain Desplats; Dean Lewis (Microelectron. Reliab., 2002)

Comprehensive failure analysis of leakage faults in bipolar transistors. - Bernadette Domengès; P. Schwindenhammer; Patrick Poirier; Felix Beaudoin; Philippe Descamps (Microelectron. Reliab., 2002)

IR confocal laser microscopy for MEMS Technological Evaluation. - Djemel Lellouchi; Felix Beaudoin; Christophe Le Touze; Philippe Perdu; Romain Desplats (Microelectron. Reliab., 2002)

Fault Localization using Time Resolved Photon Emission and STIL Waveforms. - Romain Desplats; Felix Beaudoin; Philippe Perdu; Nagamani Nataraj; Ted R. Lundquist; Ketan Shah (ITC, 2003)

Thermal laser stimulation and NB-OBIC techniques applied to ESD defect localization. - Thomas Beauchêne; Dean Lewis; Felix Beaudoin; Vincent Pouget; Romain Desplats; Pascal Fouillat; Philippe Perdu; Marise Bafleur; David Trémouilles (Microelectron. Reliab., 2003)

A physical approach on SCOBIC investigation in VLSI. - Thomas Beauchêne; Dean Lewis; Felix Beaudoin; Vincent Pouget; Philippe Perdu; Pascal Fouillat; Yves Danto (Microelectron. Reliab., 2003)

From Static Thermal and Photoelectric Laser Stimulation (TLS/PLS) to Dynamic Laser Testing. - Felix Beaudoin; Romain Desplats; Philippe Perdu; Abdellatif Firiti; Gérald Haller; Vincent Pouget; Dean Lewis (Microelectron. Reliab., 2003)

Magnetic emission mapping for passive integrated components characterisation. - Olivier Crépel; Romain Desplats; Y. Bouttement; Philippe Perdu; C. Goupil; Philippe Descamps; Felix Beaudoin; L. Marina (Microelectron. Reliab., 2003)

Faster IC Analysis with PICA Spatial Temporal Photon Correlation and CAD Autochanneling. - Romain Desplats; A. Eral; Felix Beaudoin; Philippe Perdu; Alan J. Weger; Moyra K. McManus; Peilin Song; Franco Stellari (Microelectron. Reliab., 2003)

Short defect characterization based on TCR parameter extraction. - Abdellatif Firiti; D. Faujour; Gérald Haller; J. M. Moragues; Vincent Goubier; Philippe Perdu; Felix Beaudoin; Dean Lewis (Microelectron. Reliab., 2003)

The advent of MEMS in space. - Xavier Lafontan; Francis Pressecq; Felix Beaudoin; Sebastien Rigo; M. Dardalhon; J.-L. Roux; Petra Schmitt; J. Kuchenbecker; B. Baradat; Djemel Lellouchi (Microelectron. Reliab., 2003)

Time Resolved Photoemission (PICA) - From the Physics to Practical Considerations. - Mustapha Remmach; Romain Desplats; Felix Beaudoin; E. Frances; Philippe Perdu; Dean Lewis (Microelectron. Reliab., 2003)

Solar Cell Analysis with Light Emission and OBIC Techniques. - Kevin Sanchez; Romain Desplats; Guy Perez; V. Pichetto; Felix Beaudoin; Philippe Perdu (Microelectron. Reliab., 2003)

TCAD and SPICE modeling help solve ESD protection issues in analog CMOS technology. - David Trémouilles; Géraldine Bertrand; Marise Bafleur; Felix Beaudoin; Philippe Perdu; Nicolas Guitard; Lionel Lescouzères (Microelectron. Reliab., 2003)

Femtosecond Laser Ablation for Backside Silicon Thinning. - Felix Beaudoin; J. López; M. Faucon; Romain Desplats; Philippe Perdu (Microelectron. Reliab., 2004)

Time Resolved Photon Emission Processing Flow for IC Analysis. - Romain Desplats; Gaël Faggion; Mustapha Remmach; Felix Beaudoin; Philippe Perdu; Dean Lewis (Microelectron. Reliab., 2004)

Understanding the effects of NIR laser stimulation on NMOS transistor. - Abdellatif Firiti; Felix Beaudoin; Gérald Haller; Philippe Perdu; Dean Lewis; Pascal Fouillat (Microelectron. Reliab., 2004)

Dynamic Laser Stimulation Case Studies. - Felix Beaudoin; Kevin Sanchez; Romain Desplats; Philippe Perdu; Jean Marc Nicot; J. P. Roux; M. Otte (Microelectron. Reliab., 2005)

Failure analysis of micro-heating elements suspended on thin membranes. - Danick Briand; Felix Beaudoin; Jérôme Courbat; Nico F. de Rooij; Romain Desplats; Philippe Perdu (Microelectron. Reliab., 2005)

Impact of semiconductors material on IR Laser Stimulation signal. - Abdellatif Firiti; Felix Beaudoin; Gérald Haller; Philippe Perdu; Dean Lewis; Pascal Fouillat (Microelectron. Reliab., 2005)

Oxide charge measurements in EEPROM devices. - C. De Nardi; Romain Desplats; Philippe Perdu; Felix Beaudoin; J.-L. Gauffier (Microelectron. Reliab., 2005)

NIR laser stimulation for dynamic timing analysis. - Kevin Sanchez; Romain Desplats; Felix Beaudoin; Philippe Perdu; J. P. Roux; G. Woods; Dean Lewis (Microelectron. Reliab., 2005)

Application of various optical techniques for ESD defect localization. - Fabien Essely; Frédéric Darracq; Vincent Pouget; Mustapha Remmach; Felix Beaudoin; Nicolas Guitard; Marise Bafleur; Philippe Perdu; André Touboul; Dean Lewis (Microelectron. Reliab., 2006)

Dynamic laser stimulation techniques for advanced failure analysis and design debug applications. - Felix Beaudoin; Kevin Sanchez; Philippe Perdu (Microelectron. Reliab., 2007)

Monolithically Integrated High-Performance Ge-on-Si PIN Photodetectors with Nearly 60 GHz EO Bandwidth, 0.95 A/W Responsivity, <30 nA Dark Current and -36 dB Optical Return Loss Enabled by Ge Shape Optimization. - Yusheng Bian; Abdelsalam Aboketaf; Won Suk Lee; Sujith Chandran; Edgar Huante-Ceron; Arman Najafi; Ana Villafranca; Hatef Shiran; Judson Holt; Francis Afzal; Kevin K. Dezfulian; Michelle Zhang; et al. (OFC, 2025)