Structure of the oxide damage under progressive breakdown. - Felix Palumbo; G. Condorelli; Salvatore Lombardo; Kin Leong Pey; C. H. Tung; L. J. Tang (Microelectron. Reliab., 2005)

A novel approach to characterization of progressive breakdown in high-k/metal gate stacks. - R. Pagano; Salvatore Lombardo; Felix Palumbo; Paul Kirsch; S. A. Krishnan; Chadwin D. Young; Rino Choi; Gennadi Bersuker; James H. Stathis (Microelectron. Reliab., 2008)

Radiation damage characterization of digital integrated circuits. - Santiago Martin Sondón; Pablo Sergio Mandolesi; Pedro Julián; Felix Palumbo; Martin Alurralde; Alberto Filevich (LATW, 2009)

Radiation effects in nitride read-only memories. - Sebania Libertino; Domenico Corso; G. Murè; A. Marino; Felix Palumbo; Fabio Principato; G. Cannella; T. Schillaci; S. Giarusso; F. Celi; Michael Lisiansky; Yakov Roizin; et al. (Microelectron. Reliab., 2010)

A dual core low power microcontroller with openMSP430 architecture for high reliability lockstep applications using a 180 nm high voltage technology node. - Santiago Martin Sondón; Pablo Sergio Mandolesi; Favio R. Masson; Pedro Julián; Felix Palumbo (LASCAS, 2013)

Diagnose of radiation induced single event effects in a PLL using a heavy ion microbeam. - Santiago Martin Sondón; Alfredo Falcon; Pablo Sergio Mandolesi; Pedro Julián; Nahuel Vega; Francisco Nesprias; Jorge Davidson; Felix Palumbo; Mario Debray (LATW, 2013)

General features of progressive breakdown in gate oxides: A compact model. - Felix Palumbo; Moshe Eizenberg; Salvatore Lombardo (IRPS, 2015)

Influence of gate oxides with high thermal conductivity on the failure distribution of InGaAs-based MOS stacks. - Felix Palumbo; Salvatore Lombardo; Moshe Eizenberg (Microelectron. Reliab., 2016)

Impact of forming gas annealing on the degradation dynamics of Ge-based MOS stacks. - Fernando L. Aguirre; Sebastián Matías Pazos; Felix Palumbo; Sivan Fadida; Roy Winter; Moshe Eizenberg (IRPS, 2018)

Enhanced reliability of hexagonal boron nitride dielectric stacks due to high thermal conductivity. - Xianhu Liang; Bin Yuan; Yuanyuan Shi; Fei Hui; Xu Jing; Mario Lanza; Felix Palumbo (IRPS, 2018)

Heavy Ion Microbeam Experimental Study of ASET on a Full-Custom CMOS OpAmp. - Andrés Fontana; Sebastián Matías Pazos; Fernando L. Aguirre; Felix Palumbo; Nahuel Vega; Nahuel A. Müller; Emanuel de la Fourniere; Mario Debray (SBCCI, 2018)

Performance-reliability trade-offs in short range RF power amplifier design. - Sebastián Matías Pazos; Fernando L. Aguirre; Felix Palumbo; Fernando Silveira (Microelectron. Reliab., 2018)

Spatio-Temporal Defect Generation Process in Irradiated HfO2 MOS Stacks: Correlated Versus Uncorrelated Mechanisms. - Fernando Leonel Aguirre; Andrea Padovani; Alok Ranjan 001; Nagarajan Raghavan; Nahuel Vega; Nahuel Muller; Sebastián Matías Pazos; Mario Debray; Joel Molina Reyes; Kin Leong Pey; Felix Palumbo (IRPS, 2019)

Application of the Quasi-Static Memdiode Model in Cross-Point Arrays for Large Dataset Pattern Recognition. - Fernando Leonel Aguirre; Sebastián Matías Pazos; Felix Palumbo; Jordi Suñé; Enrique Miranda 002 (IEEE Access, 2020)

Line Resistance Impact in Memristor-based Multi Layer Perceptron for Pattern Recognition. - Fernando L. Aguirre; Sebastián Matías Pazos; Felix Palumbo; N. Gomez; Enrique Miranda 002; Jordi Suñé (LASCAS, 2021)