Scan Chain Diagnosis by Adaptive Signal Profiling with Manufacturing ATPG Patterns. - Yu Huang 005; Wu-Tung Cheng; Ruifeng Guo; Ting-Pu Tai; Feng-Ming Kuo; Yuan-Shih Chen (Asian Test Symposium, 2009)

Yield Ramp up by Scan Chain Diagnosis. - Feng-Ming Kuo; Yuan-Shih Chen (Asian Test Symposium, 2009)

Case study of scan chain diagnosis and PFA on a low yield wafer. - Yu Huang 005; Brady Benware; Wu-Tung Cheng; Ting-Pu Tai; Feng-Ming Kuo; Yuan-Shih Chen (ITC, 2010)

Embedded Tutorial Summary: Diagnosis for Accelerating Yield and Failure Analysis. - Wu-Tung Cheng; Feng-Ming Kuo (Asian Test Symposium, 2012)