Fault simulation and random test generation for speed-independent circuits. - Feng Shi 010; Yiorgos Makris (ACM Great Lakes Symposium on VLSI, 2004)

SPIN-TEST: automatic test pattern generation for speed-independent circuits. - Feng Shi 010; Yiorgos Makris (ICCAD, 2004)

Compiler-Based Frame Formation for Static Optimization. - Feng Shi 010; Sobeeh Almukhaizim; Pey-Chang Lin; Yiorgos Makris (ICCD, 2004)

SPIN-SIM: Logic and Fault Simulation for Speed-Independent Circuits. - Feng Shi 010; Yiorgos Makris (ITC, 2004)

SPIN-PAC: test compaction for speed-independent circuits. - Feng Shi 010; Yiorgos Makris (ASP-DAC, 2005)

Test generation for ultra-high-speed asynchronous pipelines. - Feng Shi 010; Yiorgos Makris; Steven M. Nowick; Montek Singh (ITC, 2005)

Low-Overhead Testing of Delay Faults in High-Speed Asynchronous Pipelines. - Gennette Gill; Ankur Agiwal; Montek Singh; Feng Shi 010; Yiorgos Makris (ASYNC, 2006)

A Transistor-Level Test Strategy for C^2MOS MOUSETRAP Asynchronous Pipelines. - Feng Shi 010; Yiorgos Makris (ASYNC, 2006)

Testing delay faults in asynchronous handshake circuits. - Feng Shi 010; Yiorgos Makris (ICCAD, 2006)

Coping with Soft Errors in Asynchronous Burst-Mode Machines. - Sobeeh Almukhaizim; Feng Shi 010; Yiorgos Makris (ASYNC, 2008)

Enhancing Simulation Accuracy through Advanced Hazard Detection in Asynchronous Circuits. - Feng Shi 010; Yiorgos Makris (IEEE Trans. Computers, 2009)

Soft-Error Tolerance and Mitigation in Asynchronous Burst-Mode Circuits. - Sobeeh Almukhaizim; Feng Shi 010; Eric Love; Yiorgos Makris (IEEE Trans. Very Large Scale Integr. Syst., 2009)