Automated TTCN-3 Test Case Generation by Means of UML Sequence Diagrams and Markov Chains. - Matthias Beyer; Winfried Dulz; Fenhua Zhen (Asian Test Symposium, 2003)

MaTeLo - Statistical Usage Testing by Annotated Sequence Diagrams, Markov Chains and TTCN-3. - Winfried Dulz; Fenhua Zhen (QSIC, 2003)