A negative differential resistance effect implemented with a single MOSFET from 375 k down to 80 k. - Victor Vega-Gonzalez; Edmundo Gutierrez-Dominguez; Fernando Guarin (ESSDERC, 2013)

Non-homogeneous space mechanical strain induces asymmetrical magneto-tunneling conductance in MOSFETs. - A. Erika Pondigo de los; Edmundo A. Gutiérrez-D.; Joel Molina Reyes; Fernando Guarin (ESSDERC, 2014)

Self-heating and its implications on hot carrier reliability evaluations. - Steven W. Mittl; Fernando Guarin (IRPS, 2015)

Cap layer and multi-work-function tuning impact on TDDB/BTI in SOI FinFET devices. - Wen Liu; Andreas Kerber; Fernando Guarin; Claude Ortolland (IRPS, 2018)

Silicon Based RF Reliability Challenges for 5G Communications. - Paul Colestock; P. Srinivasan 002; Fernando Guarin (IRPS, 2020)

Thermal Characterization and TCAD Modeling of a Power Amplifier in 45RFSOI for 5G mmWave Applications. - Peter C. Paliwoda; Mohamed A. Rabie; Oscar D. Restrepo; Eduardo Cruz Silva; E. Kaltalioglu; Fernando Guarin; Kenneth Barnett; Jeffrey B. Johnson; William Taylor; Myra Boenke; Byoung Min (IRPS, 2020)

A novel methodology to evaluate RF reliability for SOI CMOS-based Power Amplifier mmWave applications. - P. Srinivasan 002; Paul Colestock; Thomas Samuels; Stephen Moss; Fernando Guarin; Byoung Min (IRPS, 2020)

Self-heating characterization and its applications in technology development. - Peter C. Paliwoda; Maria Toledano-Luque; Tanya Nigam; Fernando Guarin; M. Nour; S. Cimino; L. Pantisano; A. Gupta; Oscar Huerta-Gonzalez; M. Hauser; W. Liu; A. Vayshenker; et al. (NATW, 2020)

Large Signal RF Reliability of 45-nm RFSOI Power Amplifier Cell for Wi-Fi6 Applications. - Aarti Rathi; P. Srinivasan 002; Fernando Guarin; Abhisek Dixit (IRPS, 2021)

CMOS RF reliability for 5G mmWave applications - Challenges and Opportunities. - P. Srinivasan 002; Fernando Guarin (IRPS, 2021)

RF Reliability of SOI-based Power Amplifier FETs for mmWave 5G Applications. - P. Srinivasan 002; Fernando Guarin; Shafi Syed; Joris Angelo Sundaram Jerome; Wen Liu; Sameer H. Jain; Dimitri Lederer; Stephen Moss; Paul Colestock; Anirban Bandyopadhyay; Ned Cahoon; Byoung Min; et al. (IRPS, 2021)

Deep Cryogenic Temperature TDDB in 45-nm PDSOI N-channel FETs for Quantum Computing Applications. - Asifa Amin; Aarti Rathi; Sujit K. Singh; Abhisek Dixit; Oscar Huerta-Gonzalez; P. Srinivasan 002; Fernando Guarin (IRPS, 2022)

6G Roadmap for Semiconductor Technologies: Challenges and Advances. - Ned Cahoon; P. Srinivasan 002; Fernando Guarin (IRPS, 2022)

Parasitic Drain Series Resistance Effects on Non-conducting Hot Carrier Reliability. - M. Hauser; P. Srinivasan 002; A. Vallett; R. Krishnasamy; Fernando Guarin; Dave Brochu; V. Pham; Byoung Min (IRPS, 2022)

RF Reliability of CMOS-Based Power Amplifier Cell for 5G mmWave Applications. - Aarti Rathi; Abhisek Dixit; P. Srinivasan 002; Oscar Huerta-Gonzalez; Fernando Guarin (IRPS, 2022)

Excellent RF Product HTOL reliability of 5G mmWave beamformer chip fabricated using GF 45RFSOI technologies. - P. Srinivasan 002; Fernando Guarin; Enkhbayasgalan Gantsog; Harish Krishnaswamy; Arun Natarajan 001 (IRPS, 2022)

Impact of Non-Conducting HCI Degradation on Small-Signal Parameters in RF SOI MOSFET. - Dora A. Chaparro-Ortiz; Alan Y. Otero-Carrascal; Edmundo A. Gutiérrez-D.; Reydezel Torres-Torres; Oscar Huerta-Guevara; P. Srinivasan 002; Fernando Guarin (IRPS, 2023)

Reliability of SPST Series-stacked SOI CMOS RF Switches for mmWave Applications. - Aarti Rathi; Abhisek Dixit; Naga Satish; P. Srinivasan 002; Fernando Guarin (IRPS, 2023)

RF long term aging behavior and reliability in 22FDX WiFi Power Amplifier designs for 5G applications. - P. Srinivasan 002; J. Lestage; Shafi Syed; X. Hui; Stephen Moss; Oscar D. Restrepo; Oscar H. Gonzalez; Y. Chen; T. McKay; Anirban Bandyopadhyay; Ned Cahoon; Fernando Guarin; et al. (IRPS, 2023)