Foundation of rf CMOS and SiGe BiCMOS technologies. - James S. Dunn; David C. Ahlgren; Douglas D. Coolbaugh; Natalie B. Feilchenfeld; Greg G. Freeman; David R. Greenberg; Robert A. Groves; Fernando J. Guarín; Youssef Hammad; Alvin J. Joseph; Louis D. Lanzerotti; Stephen A. St. Onge; et al. (IBM J. Res. Dev., 2003)

Reliability and performance scaling of very high speed SiGe HBTs. - Greg G. Freeman; Jae-Sung Rieh; Zhijian Yang; Fernando J. Guarín (Microelectron. Reliab., 2004)