Locating hot carrier injection in n-type DeMOS transistors by Charge Pumping and 2D device simulations. - Filip Bauwens; Peter Moens (Microelectron. Reliab., 2004)

Thermal resistance assessment in multi-trenched power devices. - Jaume Roig; B. Desoete; Filip Bauwens; F. Lovadina; Peter Moens (Microelectron. Reliab., 2008)

Next generation of Deep Trench Isolation for Smart Power technologies with 120 V high-voltage devices. - R. Charavel; Jaume Roig; S. Mouhoubi; P. Gassot; Filip Bauwens; Piet Vanmeerbeek; B. Desoete; Peter Moens; Eddy De Backer (Microelectron. Reliab., 2010)

Improved current filament control during Zener diode zapping. - Jaume Roig; Julien Lebon; Steven Vandeweghe; Samir Mouhoubi; Filip Bauwens (Microelectron. Reliab., 2012)

Short-Circuit Study in Medium-Voltage GaN Cascodes, p-GaN HEMTs, and GaN MISHEMTs. - Manuel Fernandez; Xavier Perpiñà; Jaume Roig-Guitart; Miquel Vellvehí; Filip Bauwens; Marnix Tack; Xavier Jordà (IEEE Trans. Ind. Electron., 2017)