Thermal stability of SiC Schottky diode anode and cathode metalisations after 1000 h at 350 °C. - Donagh O'Mahony; Russell Duane; Tony Campagno; Liam Lewis; Nicolás Cordero; Pleun Maaskant; Finbarr Waldron; Brian Corbett (Microelectron. Reliab., 2011)