Assisted test design for non-intrusive machine learning indirect test of millimeter-wave circuits. - Florent Cilici; Manuel J. Barragán; Salvador Mir; Estelle Lauga-Larroze; Sylvain Bourdel (ETS, 2018)

On the use of causal feature selection in the context of machine-learning indirect test. - Manuel J. Barragán; Gildas Léger; Florent Cilici; Estelle Lauga-Larroze; Sylvain Bourdel; Salvador Mir (DATE, 2019)

Yield Recovery of mm-Wave Power Amplifiers using Variable Decoupling Cells and One-Shot Statistical Calibration. - Florent Cilici; Manuel J. Barragán; Salvador Mir; Estelle Lauga-Larroze; Sylvain Bourdel; Gildas Léger (ISCAS, 2019)

Efficient generation of data sets for one-shot statistical calibration of RF/mm-wave circuits. - Florent Cilici; Gildas Léger; Manuel J. Barragán; Salvador Mir; Estelle Lauga-Larroze; Sylvain Bourdel (SMACD, 2019)

Special Session on RF/5G Test. - William R. Eisenstadt; Mark Roos; Devin Morris; José Luis González-Jiménez; Christopery Mounet; Manuel J. Barragán; Gildas Léger; Florent Cilici; Estelle Lauga-Larroze; Salvador Mir; Sylvain Bourdel; Marc Margalef-Rovira; et al. (ETS, 2022)

An Integrated Miniaturized VNA for On-Chip PA Mismatch Measurement. - Oumayma Belkhadra; Gilles Montoriol; Emmanuel Pistone; Hugo Vallee; Florent Cilici; Manuel J. Barragán; Salvador Mir; Sylvain Bourdel (NewCAS, 2024)