A constitutive single crystal model for the silicon mechanical behavior: Applications to the stress induced by silicided lines and STI in MOS technologies. - Florian Cacho; S. Orain; G. Cailletaud; H. Jaouen (Microelectron. Reliab., 2007)

Bottom-up digital system-level reliability modeling. - N. Ruiz Amador; Vincent Huard; E. Pion; Florian Cacho; Damien Croain; V. Robert; Sylvain Engels; Philippe Flatresse; Lorena Anghel (CICC, 2011)

A bottom-up approach for System-On-Chip reliability. - Vincent Huard; N. Ruiz Amador; Florian Cacho; E. Pion (Microelectron. Reliab., 2011)

Reliability Characterization and Modeling Solution to Predict Aging of 40-nm MOSFET DC and RF Performances Induced by RF Stresses. - Laurent Negre; David Roy 001; Florian Cacho; Patrick Scheer; Sebastien Jan; Samuel Boret; Daniel Gloria; Gérard Ghibaudo (IEEE J. Solid State Circuits, 2012)

Timing in-situ monitors: Implementation strategy and applications results. - Ahmed Benhassain; Florian Cacho; Vincent Huard; M. Saliva; Lorena Anghel; C. R. Parthasarathy; Abhishek Jain 003; Fabien Giner (CICC, 2015)

Digital circuits reliability with in-situ monitors in 28nm fully depleted SOI. - M. Saliva; Florian Cacho; Vincent Huard; X. Federspiel; D. Angot; Ahmed Benhassain; Alain Bravaix; Lorena Anghel (DATE, 2015)

From BTI variability to product failure rate: A technology scaling perspective. - Vincent Huard; D. Angot; Florian Cacho (IRPS, 2015)

28nm UTBB FDSOI product reliability/performance trade-off optimization through body bias operation. - P. Mora; X. Federspiel; Florian Cacho; Vincent Huard; Wafa Arfaoui (IRPS, 2015)

Impact of gate oxide breakdown in logic gates from 28nm FDSOI CMOS technology. - M. Saliva; Florian Cacho; Cheikh Ndiaye; Vincent Huard; D. Angot; Alain Bravaix; Lorena Anghel (IRPS, 2015)

Early failure prediction by using in-situ monitors: Implementation and application results. - Ahmed Benhassain; Florian Cacho; Vincent Huard; Lorena Anghel (ERMAVSS@DATE, 2016)

Study of workload impact on BTI HCI induced aging of digital circuits. - Ajith Sivadasan; Florian Cacho; Sidi Ahmed Benhassain; Vincent Huard; Lorena Anghel (DATE, 2016)

Workload Impact on BTI HCI Induced Aging of Digital Circuits: A System level Analysis. - Ajith Sivadasan; Florian Cacho; Sidi Ahmed Benhassain; Vincent Huard; Lorena Anghel (ERMAVSS@DATE, 2016)

Hot-carrier and BTI damage distinction for high performance digital application in 28nm FDSOI and 28nm LP CMOS nodes. - Alain Bravaix; M. Saliva; Florian Cacho; X. Federspiel; Cheikh Ndiaye; Souhir Mhira; Edith Kussener; E. Pauly; Vincent Huard (IOLTS, 2016)

Activity profiling: Review of different solutions to develop reliable and performant design. - Florian Cacho; Ahmed Benhassain; Souhir Mhira; Ajith Sivadasan; Vincent Huard; P. Cathelin; Vincent Knopik; Abhishek Jain 003; C. R. Parthasarathy; Lorena Anghel (IOLTS, 2016)

In-situ slack monitors: taking up the challenge of on-die monitoring of variability and reliability. - Ahmed Benhassain; Souhir Mhira; Florian Cacho; Vincent Huard; Lorena Anghel (IVSW, 2016)

28nm FDSOI technology sub-0.6V SRAM Vmin assessment for ultra low voltage applications. - Rossella Ranica; Nicolas Planes; Vincent Huard; Olivier Weber; Daniel Noblet; Damien Croain; Fabien Giner; Sylvie Naudet; P. Mergault; S. Ibars; A. Villaret; Maryline Parra; et al. (VLSI Circuits, 2016)

Early system failure prediction by using aging in situ monitors: Methodology of implementation and application results. - Lorena Anghel; Ahmed Benhassain; Ajith Sivadasan; Florian Cacho; Vincent Huard (VTS, 2016)

Potentiality of healing techniques in hot-carrier damaged 28 nm FDSOI CMOS nodes. - Alain Bravaix; Florian Cacho; X. Federspiel; Cheikh Ndiaye; Souhir Mhira; Vincent Huard (Microelectron. Reliab., 2016)

Performance vs. reliability adaptive body bias scheme in 28 nm & 14 nm UTBB FDSOI nodes. - Cheikh Ndiaye; Vincent Huard; X. Federspiel; Florian Cacho; Alain Bravaix (Microelectron. Reliab., 2016)

Workload dependent reliability timing analysis flow. - Ajith Sivadasan; Armelle Notin; Vincent Huard; Etienne Maurin; Souhir Mhira; Florian Cacho; Lorena Anghel (DATE, 2017)

High-yield design of high-density SRAM for low-voltage and low-leakage operations. - Kedar Janardan Dhori; Hitesh Chawla; Ashish Kumar; Prashant Pandey; Promod Kumar; Lorenzo Ciampolini; Florian Cacho; Damien Croain (DFT, 2017)

Investigation of critical path selection for in-situ monitors insertion. - Florian Cacho; Ahmed Benhassain; Riddhi Jitendrakumar Shah; Souhir Mhira; Vincent Huard; Lorena Anghel (IOLTS, 2017)

Dynamic aging compensation and Safety measures in Automotive environment. - Souhir Mhira; Vincent Huard; Ahmed Benhassain; Florian Cacho; Sylvie Naudet; Abhishek Jain 003; C. R. Parthasarathy; Alain Bravaix (IOLTS, 2017)

Cognitive approach to support dynamic aging compensation. - Souhir Mhira; Vincent Huard; Ahmed Benhassain; Florian Cacho; David Meyer; Sylvie Naudet; Abhishek Jain 003; C. R. Parthasarathy; Alain Bravaix (ITC, 2017)

Enabling robust automotive electronic components in advanced CMOS nodes. - Vincent Huard; Souhir Mhira; Florian Cacho; Alain Bravaix (Microelectron. Reliab., 2017)

Characterization of Low Drop-Out during ageing and design for yield. - R. Lajmi; Florian Cacho; Estelle Lauga-Larroze; Sylvain Bourdel; Ph. Benech; Vincent Huard; X. Federspiel (Microelectron. Reliab., 2017)

NBTI aged cell rejuvenation with back biasing and resulting critical path reordering for digital circuits in 28nm FDSOI. - Ajith Sivadasan; Riddhi Jitendrakumar Shah; Vincent Huard; Florian Cacho; Lorena Anghel (DATE, 2018)

Integrated Test Structures for Reliability Investigation under Dynamic Stimuli. - Florian Cacho; D. Nouguier; M. Arabi; X. Federspiel; Y. Carminati; M. Saliva (IOLTS, 2018)

Reliability assessment of 4GSP/s interleaved SAR ADC. - Rania Lajmi; Florian Cacho; O. David; Jean-Pierre Blanc; Emmanuel Rouat; Sébastien Haendler; Ph. Benech; Estelle Lauga-Larroze; Sylvain Bourdel (IRPS, 2018)

Investigation of speed sensors accuracy for process and aging compensation. - Riddhi Jitendrakumar Shah; Florian Cacho; Vincent Huard; Souhir Mhira; D. Arora; Pankaj Agarwal; Shubham Kumar; S. Balaraman; Bijoy Kumar Singh; Lorena Anghel (IRPS, 2018)

Global and Local Process Variation Simulations in Design for Reliability approach. - Audrey Michard; Florian Cacho; Damien Celeste; Xavier Federspiel (IOLTS, 2019)

Investigation of NBTI Dynamic Behavior with Ultra-Fast Measurement. - Florian Cacho; X. Federspiel; D. Nouguier; Cheikh Diouf (IRPS, 2019)

Impact of Passive & Active Load Gate Impedance on Breakdown Hardness in 28nm FDSOI Technology. - A. P. Nguyen; Xavier Garros; M. Rafik; Florian Cacho; David Roy 001; Xavier Federspiel; Fred Gaillard (IRPS, 2019)

Hot-Carrier induced Breakdown events from Off to On mode in NEDMOS. - Alain Bravaix; Edith Kussener; David Ney; Xavier Federspiel; Florian Cacho (IRPS, 2020)

Comparison of variability of HCI induced drift for SiON and HKMG devices. - Xavier Federspiel; Cheikh Diouf; Florian Cacho; Emmanuel Vincent 004 (IRPS, 2020)

Monitoring Setup and Hold Timing Limits. - Florian Cacho; Lorena Anghel; Xavier Federspiel (IRPS, 2021)

HCI Temperature sense effect from 180nm to 28nm nodes. - Xavier Federspiel; Abdourahmane Camara; Audrey Michard; Cheikh Diouf; Florian Cacho (IRPS, 2021)

Analysis of the interactions of HCD under "On" and "Off" state modes for 28nm FDSOI AC RF modelling. - Tidjani Garba-Seybou; Xavier Federspiel; Alain Bravaix; Florian Cacho (IRPS, 2021)

BTI Arbitrary Stress Patterns Characterization & Machine-Learning optimized CET Maps Simulations. - Louis Gerrer; Jacques Cluzel; Fred Gaillard; Xavier Garros; Xavier Federspiel; Florian Cacho; David Roy 001; E. Vincent (IRPS, 2021)

Frequency dependant gate oxide TDDB model. - M. Arabi; X. Federspiel; Florian Cacho; M. Rafik; S. Blonkowski; Xavier Garros; G. Guibaudo (IRPS, 2022)

New Modelling Off-state TDDB for 130nm to 28nm CMOS nodes. - Tidjani Garba-Seybou; Xavier Federspiel; Alain Bravaix; Florian Cacho (IRPS, 2022)

Comprehensive Analysis of RF Hot-Carrier Reliability Sensitivity and Design Explorations for 28GHz Power Amplifier Applications. - Joycelyn Hai; Florian Cacho; A. Divay; Estelle Lauga-Larroze; Jean-Daniel Arnould; Jeremie Forest; Vincent Knopik; Xavier Garros (IRPS, 2022)

40nm Ultra-low Leakage SRAM with Embedded Sub-threshold Analog Closed Loop System for Efficient Source Biasing of the Memory Array in Retention Mode. - Kedar Janardan Dhori; Promod Kumar; Christophe Lecocq; Pascal Urard; Olivier Callen; Florian Cacho; Maryline Parra; Prashant Pandey; Daniel Noblet (VLSID, 2022)

Design-Time Exploration for Process, Environment and Aging Compensation Techniques for Low Power Reliable-Aware Design. - Lorena Anghel; Florian Cacho (IEEE Trans. Emerg. Top. Comput., 2022)

Minimum SRAM Retention Voltage: Insight about optimizing Power Efficiency across Temperature Profile, Process Variation and Aging. - Yunus Emre Aslan; Florian Cacho; T. Kumar; D. K. Janardan; A. Kumar; F. Giner; M. Faurichon; Lorena Anghel (IOLTS, 2023)

Location of Oxide Breakdown Events under Off-state TDDB in 28nm N-MOSFETs dedicated to RF applications. - Tidjani Garba-Seybou; Xavier Federspiel; Frederic Monsieur; Mathieu Sicre; Florian Cacho; Joycelyn Hai; Alain Bravaix (IRPS, 2023)

Integrated Test Circuit for Off-State Dynamic Drain Stress Evaluation. - Joycelyn Hai; Florian Cacho; X. Federspiel; Tidjani Garba-Seybou; A. Divay; Estelle Lauga-Larroze; Jean-Daniel Arnould (IRPS, 2023)

A Versatile 55-nm SiGe BiCMOS Technology for Wired, Wireless, and Satcom Applications. - Pascal Chevalier 002; Florian Cacho; C. Durand; N. Derrier; V. Millon; Frederic Monsieur; A. Gauthier; P. Billy; Sébastien Fregonese; Thomas Zimmer; H. Audouin; Michel Buczko; et al. (BCICTS, 2024)

Robustness Assessment Through 77GHz Operating Life Test of Power Amplifier for Radar Applications in 28nm FD-SOI CMOS. - Florian Cacho; P. Cathelin; Joycelyn Hai; S. Bouvot; Jean-Francois Jozef Nowakowski; M. Martinez; R. Debroucke; S. Jean; R. Paulin; J. Antonijevic; X. Federspiel; Nicolas Planes; et al. (IRPS, 2024)

A Methodology to Address RF Aging of 40nm CMOS PA Cells Under 5G mmW Modulation Profiles. - A. Divay; Cédric Dehos; Ismael Charlet; Fred Gaillard; B. Duriez; Xavier Garros; J. Antonijevic; Joycelyn Hai; Nathalie Revil; Jeremie Forest; Vincent Knopik; Florian Cacho; et al. (IRPS, 2024)

Non-conducting Hot carrier temperature activation and temperature sense effect. - X. Federspiel; Cheikh Diouf; B. Arunachalam; David Roy 001; Florian Cacho (IRPS, 2024)