Reliability assessment of voltage controlled oscillators in 32nm high-κ metal gate technology. - Florian Chouard; Michael Fulde; Doris Schmitt-Landsiedel (ESSCIRC, 2010)

An analog perspective on device reliability in 32nm high-κ metal gate technology. - Florian Chouard; Shailesh More; Michael Fulde; Doris Schmitt-Landsiedel (DDECS, 2011)

An aging suppression and calibration approach for differential amplifiers in advanced CMOS technologies. - Florian Chouard; Shailesh More; Michael Fulde; Doris Schmitt-Landsiedel (ESSCIRC, 2011)

Reducing impact of degradation on analog circuits by chopper stabilization and autozeroing. - Shailesh More; Michael Fulde; Florian Chouard; Doris Schmitt-Landsiedel (ISQED, 2011)