Cell Library Characterization using Machine Learning for Design Technology Co-Optimization. - Florian Klemme; Yogesh Singh Chauhan; Jörg Henkel; Hussam Amrouch (ICCAD, 2020)

Modeling Emerging Technologies using Machine Learning: Challenges and Opportunities. - Florian Klemme; Jannik Prinz; Victor M. van Santen; Jörg Henkel; Hussam Amrouch (ICCAD, 2020)

Impact of Variability on Processor Performance in Negative Capacitance FinFET Technology. - Hussam Amrouch; Girish Pahwa; Amol D. Gaidhane; Chetan K. Dabhi; Florian Klemme; Om Prakash 007; Yogesh Singh Chauhan (IEEE Trans. Circuits Syst. I Regul. Pap., 2020)

Machine Learning for Circuit Aging Estimation under Workload Dependency. - Florian Klemme; Hussam Amrouch (ITC, 2021)

Machine Learning for On-the-Fly Reliability-Aware Cell Library Characterization. - Florian Klemme; Hussam Amrouch (IEEE Trans. Circuits Syst. I Regul. Pap., 2021)

Design Close to the Edge for Advanced Technology using Machine Learning and Brain-Inspired Algorithms. - Hussam Amrouch; Florian Klemme; Paul R. Genssler (ASP-DAC, 2022)

Intelligent Methods for Test and Reliability. - Hussam Amrouch; Jens Anders; Steffen Becker 001; Maik Betka; Gerd Bleher; Peter Domanski; Nourhan Elhamawy; Thomas Ertl; Athanasios Gatzastras; Paul R. Genssler; Sebastian Hasler; Martin Heinrich; et al. (DATE, 2022)

On Extracting Reliability Information from Speed Binning. - Zahra Paria Najafi-Haghi; Florian Klemme; Hussam Amrouch; Hans-Joachim Wunderlich (ETS, 2022)

Impact of NCFET Technology on Eliminating the Cooling Cost and Boosting the Efficiency of Google TPU. - Sami Salamin; Georgios Zervakis 001; Florian Klemme; Hammam Kattan; Yogesh Singh Chauhan; Jörg Henkel; Hussam Amrouch (IEEE Trans. Computers, 2022)

GNN4REL: Graph Neural Networks for Predicting Circuit Reliability Degradation. - Lilas Alrahis; Johann Knechtel; Florian Klemme; Hussam Amrouch; Ozgur Sinanoglu (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022)

Variability-Aware Approximate Circuit Synthesis via Genetic Optimization. - Konstantinos Balaskas; Florian Klemme; Georgios Zervakis 001; Kostas Siozios; Hussam Amrouch; Jörg Henkel (IEEE Trans. Circuits Syst. I Regul. Pap., 2022)

Scalable Machine Learning to Estimate the Impact of Aging on Circuits Under Workload Dependency. - Florian Klemme; Hussam Amrouch (IEEE Trans. Circuits Syst. I Regul. Pap., 2022)

Efficient Learning Strategies for Machine Learning-Based Characterization of Aging-Aware Cell Libraries. - Florian Klemme; Hussam Amrouch (IEEE Trans. Circuits Syst. I Regul. Pap., 2022)

ML to the Rescue: Reliability Estimation from Self-Heating and Aging in Transistors All the Way up Processors. - Hussam Amrouch; Florian Klemme (ASP-DAC, 2023)

Design Automation for Cryogenic CMOS Circuits. - Victor M. van Santen; Marcel Walter; Florian Klemme; Shivendra Singh Parihar; Girish Pahwa; Yogesh Singh Chauhan; Robert Wille; Hussam Amrouch (DAC, 2023)

Upheaving Self-Heating Effects from Transistor to Circuit Level using Conventional EDA Tool Flows. - Florian Klemme; Sami Salamin; Hussam Amrouch (DATE, 2023)

Robust Resistive Open Defect Identification Using Machine Learning with Efficient Feature Selection. - Zahra Paria Najafi-Haghi; Florian Klemme; Hanieh Jafarzadeh; Hussam Amrouch; Hans-Joachim Wunderlich (DATE, 2023)

Learning-Oriented Reliability Improvement of Computing Systems From Transistor to Application Level. - Behnaz Ranjbar; Florian Klemme; Paul R. Genssler; Hussam Amrouch; Jinhyo Jung; Shail Dave; Hwisoo So; Kyongwoo Lee; Aviral Shrivastava; Ji-Yung Lin; Pieter Weckx; Subrat Mishra; et al. (DATE, 2023)

Challenges in Machine Learning Techniques to Estimate Reliability from Transistors to Circuits. - Victor M. van Santen; Florian Klemme; Paul R. Genssler; Hussam Amrouch (DFT, 2023)

Robust Pattern Generation for Small Delay Faults Under Process Variations. - Hanieh Jafarzadeh; Florian Klemme; Jan Dennis Reimer; Zahra Paria Najafi-Haghi; Hussam Amrouch; Sybille Hellebrand; Hans-Joachim Wunderlich (ITC, 2023)

SyncTREE: Fast Timing Analysis for Integrated Circuit Design through a Physics-informed Tree-based Graph Neural Network. - Yuting Hu; Jiajie Li 002; Florian Klemme; Gi-Joon Nam; Tengfei Ma 001; Hussam Amrouch; Jinjun Xiong (NeurIPS, 2023)

Transistor Self-Heating-Aware Synthesis for Reliable Digital Circuit Designs. - Florian Klemme; Hussam Amrouch (IEEE Trans. Circuits Syst. I Regul. Pap., 2023)

Time and Space Optimized Storage-based BIST under Multiple Voltages and Variations. - Hanieh Jafarzadeh; Florian Klemme; Hussam Amrouch; Sybille Hellebrand; Hans-Joachim Wunderlich (ETS, 2024)

Machine Learning Unleashes Aging and Self-Heating Effects: From Transistors to Full Processor (Invited Paper). - Hussam Amrouch; Victor M. van Santen; Javier Diaz-Fortuny; Florian Klemme (IRPS, 2024)

On the Severity of Self-Heating in FDSOI at Cryogenic Temperatures: In-depth Analysis from Transistors to Full Processor. - Anirban Kar; Florian Klemme; Yogesh Singh Chauhan; Hussam Amrouch (IRPS, 2024)

Technology Mapping for Cryogenic CMOS Circuits. - Benjamin Hien; Marcel Walter; Victor M. van Santen; Florian Klemme; Shivendra Singh Parihar; Girish Pahwa; Yogesh Singh Chauhan; Hussam Amrouch; Robert Wille (ISVLSI, 2024)

Minimizing PVT-Variability by Exploiting the Zero Temperature Coefficient (ZTC) for Robust Delay Fault Testing. - Hanieh Jafarzadeh; Florian Klemme; Jan Dennis Reimer; Hussam Amrouch; Sybille Hellebrand; Hans-Joachim Wunderlich (ITC, 2024)

Vmin Testing under Variations: Defect vs. Fault Coverage. - Hanieh Jafarzadeh; Florian Klemme; Hussam Amrouch; Sybille Hellebrand; Hans-Joachim Wunderlich (LATS, 2024)

Approximation- and Quantization-Aware Training for Graph Neural Networks. - Rodion Novkin; Florian Klemme; Hussam Amrouch (IEEE Trans. Computers, 2024)

Benchmarking Cryogenic Circuits using 5 nm FinFETs for Quantum Processing. - Anirban Kar; Shivendra Singh Parihar; Florian Klemme; Yogesh Singh Chauhan; Hussam Amrouch (ISCAS, 2025)

Robust DLBIST for Delay Fault Testing: Minimizing PVT Variability with Zero Temperature Coefficient (ZTC) Voltage. - Hanieh Jafarzadeh; Florian Klemme; Hussam Amrouch; Sybille Hellebrand; Hans-Joachim Wunderlich (LATS, 2025)

Small Delay Fault Testing with Multiple Voltages under Variations: Defect vs. Fault Coverage. - Hanieh Jafarzadeh; Florian Klemme; Hussam Amrouch; Sybille Hellebrand; Hans-Joachim Wunderlich (J. Electron. Test., 2025)