A deep analysis of SEU consequences in the internal memory of LEON3 processor. - Afef Kchaou; W. El Hadj Youssef; Rached Tourki; Fraidy Bouesse; Pablo Ramos; Raoul Velazco (LATS, 2016)

Designing reliable processor cores in ultimate CMOS and beyond: A double sampling solution. - Thierry Bonnoit; Fraidy Bouesse; Nacer-Eddine Zergainoh; Michael Nicolaidis (DATE, 2018)