Electrical characteristics of high-energy proton irradiated ultra-thin gate oxides. - Joan Marc Rafí; B. Vergnet; Francesca Campabadal; Celeste Fleta; Luis Fonseca; Manuel Lozano 003; C. Martínez; Miguel Ullán (Microelectron. Reliab., 2002)

Hot-carrier-induced degradation of drain current hysteresis and transients in thin gate oxide floating body partially depleted SOI nMOSFETs. - Joan Marc Rafí; Eddy Simoen; Kiyoteru Hayama; Abdelkarim Mercha; Francesca Campabadal; Hidenori Ohyama; Cor Claeys (Microelectron. Reliab., 2006)

2 MeV electron irradiation effects on the electrical characteristics of MOS capacitors with ALD Al2O3 dielectrics of different thickness. - Joan Marc Rafí; M. B. González; Kenichiro Takakura; I. Tsunoda; M. Yoneoka; Oihane Beldarrain; Miguel Zabala; Francesca Campabadal (Microelectron. Reliab., 2013)

Field-effect control of breakdown paths in HfO2 based MIM structures. - X. Saura; X. Lian; David Jiménez; Enrique Miranda 002; Xavier Borrisé; Francesca Campabadal; Jordi Suñé (Microelectron. Reliab., 2013)

Electrical characterization of multiple leakage current paths in HfO2/Al2O3-based nanolaminates. - Alberto Rodriguez-Fernandez; M. B. González; Francesca Campabadal; Jordi Suñé; Enrique Miranda 002 (Microelectron. Reliab., 2015)

Device variability tolerance of a RRAM-based self-organizing neuromorphic system. - Marta Pedro; Javier Martín-Martínez; Enrique Miranda 002; Rosana Rodríguez; Montserrat Nafría; M. B. González; Francesca Campabadal (IRPS, 2018)

A physically based SPICE model for RRAMs including RTN. - Gerardo González-Cordero; M. B. González; Francesca Campabadal; Francisco Jiménez-Molinos; Juan Bautista Roldán (DCIS, 2020)

Impact of Intrinsic Series Resistance on the Reversible Dielectric Breakdown Kinetics in HfO2 Memristors. - Mireia Bargallo González; Marcos Maestro-Izquierdo; Francesca Campabadal; Samuel Aldana; Francisco Jiménez-Molinos; Juan Bautista Roldán (IRPS, 2020)

Simulation of serial RRAM cell based on a Verilog-A compact model. - Binbin Yang; Daniel Arumí; Salvador Manich; Álvaro Gómez-Pau; Rosa Rodríguez-Montañés; Juan Bautista Roldán; Mireia Bargallo González; Francesca Campabadal; Liang Fang (DCIS, 2021)

An enhanced Verilog-A compact model for bipolar RRAMs including transient thermal effects and series resistance. - David Maldonado; Francisco Jiménez-Molinos; Juan Bautista Roldán; M. B. González; Francesca Campabadal (DCIS, 2022)

True Random Number Generator Based on the Variability of the High Resistance State of RRAMs. - Maryam Akbari; Sattar Mirzakuchaki; Daniel Arumí; Salvador Manich; Álvaro Gómez-Pau; Francesca Campabadal; Mireia Bargallo González; Rosa Rodríguez-Montañés (IEEE Access, 2023)

Variability in Resistive Memories. - Juan Bautista Roldán; Enrique Miranda 002; David Maldonado; Alexey N. Mikhaylov; Nikolay V. Agudov; Alexander A. Dubkov; Maria N. Koryazhkina; Mireia Bargallo González; Marco A. Villena; Samuel Poblador; Mercedes Saludes-Tapia; Rodrigo Picos; et al. (Adv. Intell. Syst., 2023)