Degradation induced by 2-MeV alpha particles on AlGaN/GaN high electron mobility transistors. - Francesca Danesin; Franco Zanon; Simone Gerardin; Fabiana Rampazzo; Gaudenzio Meneghesso; Enrico Zanoni; Alessandro Paccagnella (Microelectron. Reliab., 2006)

Characterization and analysis of trap-related effects in AlGaN-GaN HEMTs. - Mustapha Faqir; Giovanni Verzellesi; Fausto Fantini; Francesca Danesin; Fabiana Rampazzo; Gaudenzio Meneghesso; Enrico Zanoni; Anna Cavallini; Antonio Castaldini; Nathalie Labat; André Touboul; Christian Dua (Microelectron. Reliab., 2007)

Thermal storage effects on AlGaN/GaN HEMT. - Francesca Danesin; Augusto Tazzoli; Franco Zanon; Gaudenzio Meneghesso; Enrico Zanoni; Antonio Cetronio; Claudio Lanzieri; Simone Lavanga; Marco Peroni; Paolo Romanini (Microelectron. Reliab., 2008)

Electrical characterization and reliability study of HEMTs on composite substrates under high electric fields. - Augusto Tazzoli; Gaudenzio Meneghesso; Franco Zanon; Francesca Danesin; Enrico Zanoni; Philippe Bove; R. Langer; J. Thorpe (Microelectron. Reliab., 2008)