Online scheduling of concurrent Memory BISTs execution at Real-Time Operating-System level. - Francesco Angione; Paolo Bernardi; Gabriele Filipponi; Claudia Tempesta; Matteo Sonza Reorda; Davide Appello; Vincenzo Tancorre; Roberto Ugioli (DFT, 2022)

Test, Reliability and Functional Safety Trends for Automotive System-on-Chip. - Francesco Angione; Davide Appello; J. Aribido; Jyotika Athavale; Nicolò Bellarmino; Paolo Bernardi; Riccardo Cantoro; Corrado De Sio; Tommaso Foscale; Gabriele Gavarini; J. Guerrero; Martin Huch; et al. (ETS, 2022)

An Optimized Burn-In Stress Flow targeting Interconnections logic to Embedded Memories in Automotive Systems-on-Chip. - Francesco Angione; Paolo Bernardi; Gabriele Filipponi; Matteo Sonza Reorda; Davide Appello; Vincenzo Tancorre; Roberto Ugioli (ETS, 2022)

An innovative Strategy to Quickly Grade Functional Test Programs. - Francesco Angione; Paolo Bernardi; Andrea Calabrese; Lorenzo Cardone; A. Niccoletti; Davide Piumatti; Stefano Quer; Davide Appello; Vincenzo Tancorre; Roberto Ugioli (ITC, 2022)

A novel Pattern Selection Algorithm to reduce the Test Cost of large Automotive Systems-on-Chip. - Giusy Iaria; Francesco Angione; Paolo Bernardi; Matteo Sonza Reorda; Davide Appello; Giuseppe Garozzo; Vincenzo Tancorre (LATS, 2022)

On the integration and hardening of Software Test Libraries in Real-Time Operating Systems. - Francesco Angione; Paolo Bernardi; Riccardo Cantoro; Nicola Di Gruttola Giardino; Davide Piumatti; Matteo Sonza Reorda; Davide Appello; Vincenzo Tancorre (LATS, 2023)

A guided debugger-based fault injection methodology for assessing functional test programs. - Francesco Angione; Paolo Bernardi; Nicola Di Gruttola Giardino; Davide Appello; Claudia Bertani; Vincenzo Tancorre (VTS, 2023)

A Toolchain to Quantify Burn-In Stress Effectiveness on Large Automotive System-on-Chips. - Francesco Angione; Davide Appello; Paolo Bernardi; Andrea Calabrese; Stefano Quer; Matteo Sonza Reorda; Vincenzo Tancorre; Roberto Ugioli (IEEE Access, 2023)

A Low-Cost Burn-In Tester Architecture to Supply Effective Electrical Stress. - Francesco Angione; Davide Appello; Paolo Bernardi; Claudia Bertani; Giovambattista Gallo; Stefano Littardi; Giorgio Pollaccia; Walter Ruggeri; Matteo Sonza Reorda; Vincenzo Tancorre; Roberto Ugioli (IEEE Trans. Computers, 2023)

A Flexible FPGA-Based Test Equipment for Enabling Out-of-Production Manufacturing Test Flow of Digital Systems. - Nicola Di Gruttola Giardino; Francesco Angione; Paolo Bernardi; Tommaso Foscale; Claudia Bertani; Vincenzo Tancorre (DFT, 2024)

Optimizing System-Level Test Program Generation via Genetic Programming. - Denis Schwachhofer; Francesco Angione; Steffen Becker 001; Stefan Wagner 001; Matthias Sauer 002; Paolo Bernardi; Ilia Polian (ETS, 2024)

Leveraging ATE to Optimize System-Level-Test for Multicore Automotive SoCs. - Francesco Angione; Paolo Bernardi; Claudia Bertani; Lorenzo Bertetto; Lorenzo Cardone; Nicola Di Gruttola Giardino; Stefano Quer; Vincenzo Tancorre (LATS, 2025)

Special Session: Trustworthy Hardware-AI at the Cloud. - Francesco Angione; Paolo Bernardi; Alberto Bosio; Harish Dattatraya Dixit; Salvatore Pappalardo; Annachiara Ruospo; Ernesto Sánchez 001; Arani Sinha; Vittorio Turco (VTS, 2025)

System-Level Test techniques for Automotive SoCs. - Francesco Angione (2025)

A System-Level Test Methodology for Communication Peripherals in System-on-Chips. - Francesco Angione; Paolo Bernardi; Nicola Di Gruttola Giardino; Gabriele Filipponi; Claudia Bertani; Vincenzo Tancorre (IEEE Trans. Computers, 2025)

Automatic Generation of System-Level Test for Un-Core Logic of Large Automotive SoC. - Francesco Angione; Paolo Bernardi; Giusy Iaria; Claudia Bertani; Vincenzo Tancorre (IEEE Trans. Computers, 2025)