Design, Characterization & Modelling of a CMOS Magnetic Field Sensor. - Laurent Latorre; Yves Bertrand; P. Hazard; Francis Pressecq; Pascal Nouet (DATE, 1999)

Impact of Technology Spreading on MEMS design Robustness. - Vincent Beroulle; Laurent Latorre; M. Dardalhon; Coumar Oudéa; Guy Perez; Francis Pressecq; Pascal Nouet (VLSI-SOC, 2001)

The advent of MEMS in space. - Xavier Lafontan; Francis Pressecq; Felix Beaudoin; Sebastien Rigo; M. Dardalhon; J.-L. Roux; Petra Schmitt; J. Kuchenbecker; B. Baradat; Djemel Lellouchi (Microelectron. Reliab., 2003)

Application of MEMS behavioral simulation to Physics of Failure (PoF) modeling. - Petra Schmitt; Francis Pressecq; Xavier Lafontan; Q.-H. Duong; Patrick Pons; Jean Marc Nicot; Coumar Oudéa; Daniel Estève; Jean-Yves Fourniols; Henri Camon (Microelectron. Reliab., 2003)

Impact of the space environmental conditions on the reliability of a MEMS COTS based system. - Petra Schmitt; Xavier Lafontan; Francis Pressecq; B. Kurz; Coumar Oudéa; Daniel Estève; Jean-Yves Fourniols; Henri Camon (Microelectron. Reliab., 2004)

Thermal and electrostatic reliability characterization in RF MEMS switches. - Q.-H. Duong; Lionel Buchaillot; Dominique Collard; Petra Schmitt; Xavier Lafontan; Patrick Pons; F. Flourens; Francis Pressecq (Microelectron. Reliab., 2005)

FTIR spectroscopy for the hermeticity assessment of micro-cavities. - David Veyrié; Djemel Lellouchi; J.-L. Roux; Francis Pressecq; Angie Tetelin; Claude Pellet (Microelectron. Reliab., 2005)